Tektronix DSA8300 Digital Sampling Oscilloscope

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Product Description

Tektronix DSA8300 Digital Sampling Oscilloscope

Deskripsi Teknis Tentang Produk Tektronix DSA8300 Digital Sampling Oscilloscope

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 Series provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Spesifikasi Tentang Produk Tektronix DSA8300 Digital Sampling Oscilloscope



Electrical module signal measurement accuracy: 

  • Ultra-low system jitter (<100 fs, typical)
  • > 70GHz
<100 fs intrinsic jitter enables the characterization of high bit-rate (40 and 100 (4´25) Gb/s) devices with typically <5% of the signal’s unit interval being consumed by the test instrumentation. 70 GHz bandwidth allows full characterization of high bit-rate signals (5th harmonic to data rates of 28 Gb/sec and 3rd harmonic to data rates >45 Gb/sec).
Industry’s lowest system noise at all bandwidths: 

  • 600 µV max (450 µV typ.) @ 60 GHz
  • 380 µV max (280 µV typ.) @ 30 GHz
Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe. High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels.
Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4×25) Ethernet. Provides cost-effective and versatile optical test system for single and multi-mode optical standards from 155 Mb/s (OC3/STM1) to 40 Gb/s (SONET/SDH and 40GBase Ethernet) and 100 Gb/s Ethernet (100GBase-SR4, -LR4 and ER4) at 850, 1310 and 1550nm.
Superior acquisition throughput with up to 300 kS/s maximum sample rate. Reduced manufacturing or device characterization test-time by 4X with superior system throughput.
Ability to place the samplers adjacent to the device under test (DUT). Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed.
Independent calibrated channel de-skew. Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing.


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